Language

Home > Product:Spectrometry > Light Measurement > Array Spectrometer > Array Spectrometer MCPD-9800

Array Spectrometer MCPD-9800

Multipurpose spectrometer covering UV to NIR wavelength range. Shortest integration time is 5ms. Using optical fiber, various measurement optics can be configured for versatile application, including micro spot spectrum, light source, transmittance, reflectance, object color and thickness measurement.

Product

Feature
Choose best suitable model on your need

There are three models with twelve wavelength ranges, including flag ship model of MCPD-9800. No matter what customer needs and application, we propose best suitable model to you.。

 

USB and LAN as communication interface

General purpose USB port and LAN port equipped for user’s convenient and wider application.

 

High speed and high sensitivity spectrum acquisition

Monitoring UV/VIS/NIR spectrum with either 512ch or 1024ch detector at 5msec interval is possible with high speed and high precision.

 

Flexible optics configured with optical fiber.

Using standard optical fiber, flexible optics can be configured without any restriction of sample shape and sizes. Besides, microscope and large sample stage can also be integrated, achieving superior performance in any industrial fields

 

Trustworthy
Highest performance complying with Japan Industrial Standard (JIS)

MCPD series satisfies every required accuracies for spectrophotometer based on.

Japan Industrial Standard, JIS Z 8724
(Methods of color measurement – Light-source color)

  1. Precision of wavelength scale
  2. Linearity and repeatability of response
  3. Stray light
  4. Effective light-intercepting face of polychromator
  5. Collimating optical system

 

Optical Measurement Evaluation Center (JCSS/JNLA)

Otsuka Electronics is accredited as optical calibration service provider compliant with JCSS(Japan Calibration Service System)

  • Also accredited as international MRA (Mutual Recognition Arrangement) compliance calibration service provider.
  • Provides  optical traceability which is required for measurement of lighting products

And accredited as test provider for optical performance evaluation for LED and general lighting products based upon JNLA (Japan National Laboratory Accreditation System)

  • Also accredited as international MRA compliance JNLA test provider.
  • Provides evaluation data compliant with JIS(Japan Industry Standard) of optical property measurement , in order to fairly evaluate lighting products

Otsuka Electronics contributes to recognition and growth of eco-environment friendly lighting appliances by providing optical measurement traceability and its technologies.

 

Customization
Satisfy versatile customer needs

Otsuka Electronics provides customer cutting edge and turnkey solution using long expertise and wide knowledge, as well as various optical accessories,optional unit and analysis software.

MCPD-9800

Array Spectrometer MCPD-9800

Array Spectrometer MCPD-9800






 

 

Feature
  • Wide dynamic range suitable for luminous flux measurement
  • Stray light correction function equipped for UV measurement. Now only 20% of stray light level compared to last generation model
  • Wide integration time range between 5msec and 65sec, suitable for very weak light source, high speed needs and production line
  • Equipped scrambling fiber to achieve high reproducibility.
  • Light weight and compact. 60% downsizing from last generation model.

 

Measure item
  • Luminescence Spectrum
  • Transmission/Absorption Spectrum
  • Reflection Spectrum
  • Photoluminescence
  • Object Color
  • Light Source Color (Chromaticity, Luminance, Illuminance)
  • Film Thickness
  • Plasma Emission Spectrum

 

Specification
Model MCPD-9800
2285C 3095C 3683C 311C 916C
Wavelength Range(mm) 220~850 300~950 360~830 360~1100 900~1600
Spectroscope Flat Field Type
Detector
(ch)
Electro-cooling CCD Image Sensor

Electro-cooling
InGaAs
Image Sensor

 

512 1024 512 1024 512 1024 512 1024 512
Theoretical Resolution
(nm)
1.4 0.7 1.4 0.7 1.0 0.5 1.6 0.8 1.9
Optical Fiber Quartz Scramble Fiber,φ12 mm, 2 meter long Ge-doped
Quartz Fiber,
2 meter long
Integration time 5ms~20s 1ms~10s
Interface USB or LAN
Power and voltage 125VA, Single phase AC100-240V 50/60Hz
Size and weight 105(W)×230(H)×280(D)mm,  6kg

 

MCPD-6800

Array Spectrometer MCPD-6800

Array Spectrometer MCPD-6800
 

 

Feature

MCPD-6800 is entry grade spectrometer for spectrum measurement and analysis. Using optical fiber and various accessories, flexible measurement optics can be configured for versatile user application. Wavelength range can be chosen from four types.

 

Measure item
  • Luminescence Spectrum
  • Transmission/Absorption Spectrum
  • Reflection Spectrum
  • Photoluminescence
  • Object Color
  • Light Source Color (Chromaticity, Luminance, Illuminance)
  • Film Thickness
  • Plasma Emission Spectrum

 

Specification
Model MCPD-6800
2285C 3095C 3683C 3610C
Wavelength Range(mm) 220~850 300~950 360~830 360~1000
Spectroscope Flat Field Type
Detector
(ch)
Electro-cooling PDA
512 512 512 512
Theoretical Resolution
(nm)
1.5 1.5 1.1 1.7
Optical Fiber Quartz Fiber φ12 mm, 2 meter long
Integration time 16ms~65s
Interface USB or LAN
Power and voltage 100VA, Single phase AC100-230V 50/60Hz
Size and weight 105(W)×215(H)×280(D)mm,  5.5kg

 

Applications

Luminescence
Applications
◎Luminescence and Photoluminescence
◎PDP fluorescence measurement

 

Luminous flux
Applications
◎Luminous flux of LED and EL

 

Goniophotometer
Applications
◎Spectrum distribution by angle using motorized goniophotometer
◎Angle dependent distribution of light intensity and color

 

Surface color measurement
Reflectance

Applications
◎Color control and test of painted surface
◎Paper and printed materials
◎Textile, powder and plastic

 

Reflectance
Applications
◎Surface characteristics of optical material and reflector
◎Glasses
◎Anti reflection film

 

Transmission / Absorbance

Applications
◎Color control and test of painted surface
◎Paper and printed materials
◎Textile, powder and plastic

 

Thickness
Applications
◎Thickness of film and coating on various substrate such as wafer, glass and aluminum

 

Microscopic measurement
Applications
◎Micro spot measurement under microscope (Reflectance, Transmittance, Absorbance)
◎Thickness of various film and coating

 

Solution measurement

Applications
◎Absorption spectrum of various solutions
◎Concentration of solved materials

 

Multi point measurement
Applications
◎Reflectance spectrum of anti reflection film
◎Coating film
◎Films on various substrate

 

Production line
Applications
◎Thickness and reflectance of anti reflection film
◎Quality control of function film

 

Related Information