Contact-Free Thickness Meter Emios
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This meter pursues user-friendliness in an uncomplicated manner with “one step operation” such as just placing a sample on the tray for quick analysis. This meter aims to streamline the inspection process by easily measuring absolute thickness without a calibration curve, with high precision and with high resolution. Due to our unique optical geometry being designed as compact, this meter carries out non-contact measurement with high precision of even opaque, rough surface and/or flexible samples.
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- Product
- Specifications
- Configuration
- Comparison
- Examples
Product
- Instantaneously obtain absolute thickness values in digital form, without a calibration curve.
- The distance measurement is carried out with `light` to provide high repeatability, high accuracy and high resolution.
- Compact and space-saving due to our unique design.
- The minuscule measurement spot has an advantage for measurement of uneven thickness 'mura'.
Specifications
Configuration
Anyone can use easily as "one step operation".
Irradiate the front side and rear side of the sample with light and measure the distance from the reference surfaces.
Comparison
Emios | Contact- type thickness meter | X-ray thickness meter | Displacement meter |
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Samples | Gel sheet | ○ | × | ○ | ○ |
Non-woven fabric | ○ | × | ○ | × | |
Metallic plate | ○ | ○ | ○ | ○ | |
Resin | ○ | ○ | ○ | ○ | |
Porous material | ○ | △ | ○ | × | |
Ceramic | ○ | ○ | ○ | × | |
Paper/wood | ○ | ○ | ○ | × | |
Measurement conditions | Measurement time | ○ Fast | ○ | ○ | ○ |
Non-contact measurement | ○ Non-contact | × | ○ | ○ | |
Pre-treatment | ○ Not necessary | ○ | × | ○ | |
Calibration curve | ○ Not necessary | ○ | × | ○ | |
Height adjustment | ○ Not necessary | ○ | ○ | × |
Examples
- Product
- Specifications
- Configuration
- Comparison
- Examples
Related Information
Related Product
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Optical Thickness Meter OPTM series |
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Thickness Monitor FE-300 |
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Spectrum Ellipsometer FE-5000/5000S |