Medical	Medical
Analytical	Zeta Potential Particle Size Molecular Weight Capillary Electrophoresis Spherulite diam./Corr. Length
Spectrometry	Spectrometer Thickness Measurement Light Measurement FPD Evaluation Material Evaluation In-Process Evaluation

Medical

Medical
Analytical

Zeta Potential

Particle Size

Molecular Weight

Capillary Electrophoresis

Spherulite diam./Corr. Length
Spectrometry
Spectrometer

Thickness Measurement
- Thickness Monitor
- Optical Thickness Meter OPTM series
- Contact-Free Thickness Meter Emios
- Line-Scan Thickness Monitor (In-line type)
- Line-Scan Thickness Monitor (Off-line type)
- Thickness Monitor FE-300
- Spectrum Ellipsometer FE-5000/5000S
- Built-in film thickness monitor　FE-3
- Si Wafer Thickness Monitor
- Si Wafer Thickness Monitoring System　SF-3
Light Measurement

FPD Evaluation

Material Evaluation
In-Process Evaluation
List of Product
Discontinued Products

Contact-Free Thickness Meter Emios

This meter pursues user-friendliness in an uncomplicated manner with “one step operation” such as just placing a sample on the tray for quick analysis.

This meter aims to streamline the inspection process by easily measuring absolute thickness without a calibration curve, with high precision and with high resolution.

Due to our unique optical geometry being designed as compact, this meter carries out non-contact measurement with high precision of even opaque, rough surface and/or flexible samples.

Product
Specifications
Configuration
Comparison
Examples

Product

Features

Instantaneously obtain absolute thickness values in digital form, without a calibration curve.
The distance measurement is carried out with `light` to provide high repeatability, high accuracy and high resolution.
Compact and space-saving due to our unique design.
The minuscule measurement spot has an advantage for measurement of uneven thickness 'mura'.

Specifications

Configuration

Anyone can use easily as "one step operation".

Anyone can use easily as "one step operation".
Anyone can use easily as “one step operation”.

Principle

Irradiate the front side and rear side of the sample with light and measure the distance from the reference surfaces.

Irradiate the front side and rear side of the sample with light and measure the distance from the reference surfaces.d=dall-(d1+d2)

Comparison

Examples of samples and comparison of measurement methods

		Emios	Contact- type thickness meter	X-ray thickness meter	Displacement meter
Samples	Gel sheet	○	×	○	○
	Non-woven fabric	○	×	○	×
	Metallic plate	○	○	○	○
	Resin	○	○	○	○
	Porous material	○	△	○	×
	Ceramic	○	○	○	×
	Paper/wood	○	○	○	×
Measurement conditions	Measurement time	○ Fast	○	○	○
	Non-contact measurement	○ Non-contact	×	○	○
	Pre-treatment	○ Not necessary	○	×	○
	Calibration curve	○ Not necessary	○	×	○
	Height adjustment	○ Not necessary	○	○	×

Examples

Measurement examples

Measurement example1

Measurement example2

Measurement example3

Product
Specifications
Configuration
Comparison
Examples

Related Information

Related Product

	Optical Thickness Meter OPTM series
	Thickness Monitor FE-300
	Spectrum Ellipsometer FE-5000/5000S