Polymer Phase Structure Analyzer PP-1000 Principle

This measures in crossed-nicols (polarizer and analyzer are orthogonal).
A scattering pattern will appear if the scatterer is optically anisotropic (birefringent) which allows the user to evaluate the size, orderliness, and orientation of higher order structures of polymers.

(Measurement example) Analysis of the spherulite diameter of crystallization film

A four-leaf clover shape Hv scattering pattern is obtained when the spherulitic structure of crystalline polymers are being formed.
The scattering intensity reaches a maximum at azimuth angle 45°, and the scattering vector (q) is plotted on the horizontal axis and the scattering intensity (Is) is plotted on the vertical axis.
With this, a scattering profile with the measurement angle θmax, which is the maximum scattering intensity, can be obtained. Using this θmax, the spherulite radius can be calculated from the following equation:

~Introduction of each scattering pattern~

Measures with parallel nicols (polarizer and analyzer are parallel).

• Evaluation of phase separation process of polymer blends
• Size of `sea-island` structure (correlation length)
• Evaluation of particle size　※etc

※ The volume fraction of the `island` portion of the `sea-island` structure is required

(Example of measurement) Analysis of correlation length of phase separation structure

When it has a disordering structure such as a `sea-island` structure, a circular Vv scattering pattern can be obtained.
The correlation length ξ of a sample can be obtained using a Debye-Bueche plot (a graph plotting q2 on the horizontal axis and Is-1/2 on the vertical axis).
The analysis is based on the following equation. If the slope of the linearly approximated straight line is a and the intercept is b in the specified range, the correlation length ξ can be obtained from the following equation:

~Introduction of each scattering pattern~