Spectroscopic Characterization Instrument
Array Spectrometer MCPD-9800/6800 series
Features
- Choose best suitable model on your need
- USB and LAN as communication interface
- High speed and high sensitivity spectrum acquisition
- Flexible optics configured with optical fiber.
Measurement Items
- Transmission/Absorption Spectrum
- Reflection Spectrum
- Object Color
- Light Source Color
- Film Thickness
Total Luminous Flux Measurement System HM/FM Series
Features
- Accommodates Maximum 2400mm fluorescent tube
- ESNA LM79 and LM-80 compliant
- Wide dynamic range thanks to high performance array spectrometer
- Wide sphere diameter range between φ250 mm and φ3,000 mm
- L-I-V, Pulse, PWM, Tem. Control (-40 c to+200 c) measurement are available
- PWM (Pulse Width Modulation) applicable
Measurement Items
- Total luminous flux
- Total radiant flux
- SDCM
- Chromaticity
- Other
LCD Cell Gap Measurement RETS series
Features
- Polarization Optical System and Array Spectrometer
- Measures various size of samples (from 1mm optical element to 10th generation large LCD panels)
- Complying LCD production requirement for safety measure and dust prevention
Measurement Targets
- LCD Cell
- Optical Material
Measurement Items
- Filled cell gap
- Twist angle
- Rubbing angle
- Pretilt angle
- Empty cell gap
- Retardation dispersion
- Optical axis
- Ellipticity/ Azimuth angle
- Three-dimensional refractive index
- Spectrum / chromaticity
High-speed LED Spectrometer LE series
Features
- Synchronized with control signal in production line
- Flexible/various measurement system with optical fiber
- High speed test – short exposure time (Min. 2ms/ LE-5400)
- High speed measuring cycle -test/calculation/evaluation (Half a time compared with conventional model)
Measurement Items
- Tristimulus value
- Chromaticity
- Other
Goniophotometric Measurement System GP series
Features
- Goniophotometric measurement for LED luminaries up to 2400 mm.
- Spectral distribution at each angle by controlling two-axis goniophotometer automatically to obtain total luminous flux with zonal spherical function.
- Goniophotometric measurement for large displays.
- Wide dynamic range with brand-new detector.
- Complying with IESNA LM-75 and CIE121
- Usable for both Type B and Type C.
- Goniophotometric measurement at both UV and NIR region (Spectral radiant flux calculation available)
Measurement Items
- Angular distribution
- Spectral radiant flux
- Chromaticity
- Other
Color Filter Spectral Inspection System LCF series
Features
- Provides comprehensive inspection capabilities for color filter manufacturing processes, including transmission spectrum measurement, color measurement, concentration measurement, film-thickness measurement, and reflection spectrum measurement.
- Suitable for a variety of evaluation applications, including optical-property evaluation of color filters and thin-film analysis of films on glass substrates.
- The autofocus function and automatic pixel alignment capability enable highly accurate measurements and support fully automated inspection through recipe registration.
Measurement Targets
- R
- G
- B
- ITO
- PI
- Principle
- OC
- BM
Measurement Items
- Color Filter Evaluation
- Thickness Measurement
High speed retardation measurement system RE-200
Features
- Low (residual) retardation measurement from 0 nm
- High-speed retardation (Re.) measurement and optical axis simultaneous detection
- （Processing in less than 0.1 seconds, the fastest in the world）
- High repeatability due to no drive
- Easy to measure with few parameters to set
- Various wavelengths other than 550 nm are available
- Rth measurement and omni azimuthal measurement are available
- （Requires optional auto-rotating tilt unit)
- Combined with a tensile tester, it is possible to evaluate the photoelasticity simultaneously with the polarization characteristics of the film
- (This system is custom made.）
Measurement Targets
- Optical film
- retardation film
- ellipsoidal film
- retardation plate
- polarizing film
- function added polarizing film
Measurement Items
- Retardation（ρ[deg.], Re[nm]）
- Principal axis azimuth（θ[deg.]）
- Ellipticity（ε）/Azimuth（γ）
- 3D refractive index（NxNyNz）
Retardation Film Inspection System RETS-100nx
Features
- High-precision measurement due to our original spectrometer
- Extremely high retardation measurement -Super Retardation Film can be measured with high speed and high precision-
- Multi-layered film measurement -Lamination state of various films can be measured non-destructive without peeling-
- Correction function for axis direction -Easy and reproducible measurement even if sample is misaligned-
- Simple software -Measurement time and processing time are greatly reduced. Greatly improved operability-
