High speed retardation measurement system
RE-200

High quality control of Optical axis! 3σ≦0.02°
for low retardation measurement"
Measurement Targets
  • Optical film
  • retardation film
  • ellipsoidal film
  • retardation plate
  • polarizing film
  • function added polarizing film
Measurement Items
  • Retardation(ρ[deg.], Re[nm])
  • Principal axis azimuth(θ[deg.])
  • Ellipticity(ε)/Azimuth(γ)
  • 3D refractive index(NxNyNz)
Features
  • Low (residual) retardation measurement from 0 nm
  • High-speed retardation (Re.) measurement and optical axis simultaneous detection
  • (Processing in less than 0.1 seconds, the fastest in the world)
  • High repeatability due to no drive
  • Easy to measure with few parameters to set
  • Various wavelengths other than 550 nm are available
  • Rth measurement and omni azimuthal measurement are available
  • (Requires optional auto-rotating tilt unit)
  • Combined with a tensile tester, it is possible to evaluate the photoelasticity simultaneously with the polarization characteristics of the film
  • (This system is custom made.)

Spectroscopic Characterization Instrument About the High speed retardation measurement system RE-200

High quality control of Optical axis! 3σ≦0.02° for low retardation measurement

Measurement Items

Retardation

(ρ[deg.], Re[nm])

Principal axis azimuth

(θ[deg.])

Ellipticity(ε)/Azimuth(γ)

3D refractive index

(NxNyNz)

Measurement Targets

  • Optical filmretardation filmellipsoidal filmretardation platepolarizing filmfunction added polarizing filmpolarizing plate
  • Transparent and anisotropic materials such as resin and glass (optical strain on glass etc.)

Principle

What is RE-200?

RE-200 is available to measure phase difference (retardation) and principal axis azimuthwith high speed and high accuracy due to combine a polarization measurement module composed of a photonic crystal element (polarization element) and a CCD camera with transmissive polarization optics. Since the polarization intensity pattern is acquired with one shot of the CCD camera, there is no mechanism for rotating the polarizer, and the whole system has a compact configuration, so stable performance can be maintained even for a long time continuous measurement.

Ellipticity(ε)and Azimuth(γ) are calculated by Fitting and Fourier transform algorithm.

Ellipticity(ε)and Azimuth(γ) are calculated by Fitting and Fourier transform algorithm.
Optical geometry and measurement principle

Specifications

Model

RE series

Sample size Minimum 10 × 10 mm to Maximum 100 × 100 mm
Measuring wavelength

550 nm (Standard type)*1

Measurement range of retardation about 0 nm to 1 μm
Axis detection repeatability

0.05°(at 3σ) *2

Detector Polarization measurement module
Size of measurement spot 2.2 mm × 2.2 mm
Light source 100 W Halogen lamp or LED source
Main body Dimensions (W × D × H) 300 × 560 × 430 mm
Weight Approx. 20 kg


*1 Other wavelengths available.
*2 Quartz waveplate (approx. 55 nm, 2-plate type)

Options

Rth measurement and omni azimuthal measurement are available
※ Auto-rotating tilt unit(Rotation:180°, Tilt:±50°)

Auto-rotating tilt unit

Auto-rotating tilt unit

Measurement Examples

Viewing angle improvement
film A

Viewing angle improvement film A

Viewing angle improvement
film B

Viewing angle improvement film B

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