Search

Polymer Phase Structure Analyzer
PP-1000

PP-1000 analyzes the structure of polymers and film in-situ (on site) and in real time by using the small angle light scattering method. This analyzer is able to analyze larger structures (μm order) compared to analyzers that use x-rays and neutron beams because it uses visible light.
Evaluation of optical anisotropy and analysis of spherulite diameter of crystalline film can be carried out from Hv scattering which uses polarizers. Analysis of polymer blend correlation length can be carried out from Vv scattering.
Contact Us
Features
  • Measures scattering angle of 0.33 to 45 degrees in 10 msec at the fastest*
  • Evaluates structures of submicron to several hundred micron size
  • Measures solution samples with specialized cells
  • Allows user to easily switch between Hv and Vv scattering with software
  • Can be set up in labs because it is a table-top type
  • * When not using HDR function
Contact Us

Particle Size Analyzer About PP-1000

PP-1000 analyzes the structure of polymers and film in-situ (on site) and in real time by using the small angle light scattering method. This analyzer is able to analyze larger structures (μm order) compared to analyzers that use x-rays and neutron beams because it uses visible light.
Evaluation of optical anisotropy and analysis of spherulite diameter of crystalline film can be carried out from Hv scattering which uses polarizers. Analysis of polymer blend correlation length can be carried out from Vv scattering.

Measurement Items

Phase separation process of polymer blends

Crystallization process of polymers

Calculation of crystal size, crystallization growth rate

Orientation state

Aggregation process

Thermoset process

Structure change when temperature change occurs

Structure change caused by stretching

※These items require separate consultation. Please feel free to contact us about details for these items.

Curing process caused by ultraviolet light

※These items require separate consultation. Please feel free to contact us about details for these items.

Measurement Range (Theoretical Value)

Spherulite diameter
1.3 to 175 μm

Correlation length
0.1 to 100 μm

Measurement Examples

Principle

Specifications

Measurement principle

 Small angle light scattering method
Light source Semiconductor laser（wavelength 785 nm）
Detector CMOS Camera
Measurement range
(Theoretical value)		 Spherulite diameter 1.3 to 175 μm
Correlation length 0.1 to 100 μm
Dynamic range From 120 db +（when using HDR function）
Measurement angle 0.33° to 45°（dependent on camera length）
camera length 50 mm ：Angle range 2°–45°／Angular resolution 0.3°
camera length 150 mm ：Angle range 0.67°–18.4°／Angular resolution 0.1°
camera length 300 mm ：Angle range 0.33°–9.5°／Angular resolution 0.05°
Obtained pattern Hv scattering pattern,Vv scattering pattern
Measurement spot Approx. 1 mm
Beam stopper φ3 mm
Measurement time 10 msec～※
Power requirements AC 100 - 240 V 75 VA
Dimensions (W × D × H) 350 × 500 × 760 mm
Data processing unit Laptop PC（Windows10）

※When using HDR function 100 msec～

HDR

Abbrevation of `High Dynamic Range Imaging`
Technology that combines multiple photographs of different exposure levels.

Options

  • Heating and cooling stage
  • Sample stretching stage

※Other stage setups possible. Please feel free to contact us about details.

List of Products
Support

Contact

Please feel free to contact us with any inquiries or requests.

Otsuka Electronics
Members Site

The Otsuka Electronics Members Site offers the following services.
We will continue to provide a wide range of content designed to enhance your professional knowledge and support your work.

Key Features of the
Members Site

  • Download product catalogs

  • Download technical documents

  • Watch member-only videos.

Feel free to reach out with any requests or questions.

Contact Us
PAGE TOP

Search