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Retardation Film Inspection System
RETS-100nx

RETS-100nx is a retardation measuring system for all kinds of films such as OLED polarizing plate, laminated retardation film and polarizing plate with retardation film for IPS liquid crystal.
Extremely high retardation as 60,000 nm can be measured with high speed and high precision. Lamination state of film can be measured "non-destructive without peeling".
Furthermore, on the operation, simple software and a correction function that copes with misalignment due to sample re-placement are installed. High-precision measurement can be easy to use.
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Features
  • High-precision measurement due to our original spectrometer
  • Extremely high retardation measurement -Super Retardation Film can be measured with high speed and high precision-
  • Multi-layered film measurement -Lamination state of various films can be measured non-destructive without peeling-
  • Correction function for axis direction -Easy and reproducible measurement even if sample is misaligned-
  • Simple software -Measurement time and processing time are greatly reduced. Greatly improved operability-
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Spectroscopic Characterization Instrument About the Retardation Film Inspection System RETS-100nx

RETS-100nx is a retardation measuring system for all kinds of films such as OLED polarizing plate, laminated retardation film and polarizing plate with retardation film for IPS liquid crystal. Extremely high retardation as 60,000 nm can be measured with high speed and high precision.
Lamination state of film can be measured "non-destructive without peeling".
Furthermore, on the operation, simple software and a correction function that copes with misalignment due to sample re-placement are installed. High-precision measurement can be easy to use.

Features

High-precision measurement due to our original spectrometer

■ High precision
High precision achieved due to muti-wavelength measurement

[ Reason of high precision ]

  • Original High performance multi-channnel spectrophotometer is used.
  • High-precision measurement is possible, because a large amount of transmittance information can be obtained.
    (The obtained transmittance information is about 500 wavelengths, about 50 times that of other companies' products)
Reason of high precision

■ Wide measurement range
(Retardation range: 0 ～ 60,000 nm)

Wide measurement range(Retardation range: 0 ～ 60,000 nm)

■ Wavelength dispersion of retardation can be obtained

Wavelength dispersion of retardation can be obtained

Extremely high retardation measurement -Super Retardation Film can be measured with high speed and high precision-

■ High retardation

High retardation

Multi-layered film measurement -Lamination state of various films can be measured non-destructive without peeling-

Multi-layered film measurement -Lamination state of various films can be measured non-destructive without peeling-

Correction function for axis direction -Easy and reproducible measurement even if sample is misaligned-

■ Samples were replaced 10 times and the results were compared with and without axis correction
【 Sample：Retardation film R85 】

Samples were replaced 10 times and the results were compared with and without axis correction

Simple software -Measurement time and processing time are greatly reduced. Greatly improved operability-

Simple software -Measurement time and processing time are greatly reduced. Greatly improved operability-

Specifications

Model

Retardation Film Inspection System RETS-100nx
Measurement items
(film, optical material)		 Retardation (wavelength dispersion), Slow axis, Rth *1, 3-D refractive index *1, etc.
Measurement items
(polarizing plate)		 Absorption axis, Polarization degree, Extinction ratio, Various chromaticities, Various transmittances, etc.
Measurement items (LCD cell) Cell gap, Pre-tilt angle*1,Twist angle, Alignment angle, etc.
Retardation measurement range 0 to 60,000 nm
Retardation repeatability σ ≦ 0.08 nm （quartz wave plate about 600 nm）
Cell gap measurement range 0 to 600 μm （when Δn=0.1）
Cell gap repeatability 3σ ≦ 0.005 μm （about 3 μm, when Δn=0.1）
Axis detect repeatability 3σ ≦ 0.08° （quartz wave plate about 600 nm）
Wavelenth range 400 to 800 nm （selectable other range）
Detector High performance multi-channnel spectrophotometer
Measurement spot φ2 mm （standard spec.）
Light source 100 W Halogen lamp
Data processing unit PC, Monitor
Standard sample stage 100 mm × 100 mm （Fixed stage）
Options ・Extremely high retardation measurement
・Multi-layered film measurement
・Axis angular correction
・Automatic Cartesian stage
・Automatic tilt-rotation stage


*1 Require optional Automatic tilt-rotation stage

Optics

Fixed stage 【 Option：Axis angular correction 】

Fixed stage

Automatic tilt-rotation stage 【 Option 】

Automatic tilt-rotation stage 【 Option 】

Automatic Cartesian stage 【 Option 】

Automatic Cartesian stage 【 Option 】
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