MINUK is capable of evaluating transparent foreign substances and defects in the nano-order, obtaining height direction information in a single shot, and making non-destructive, non-contact and non-invasive measurements.
MINUK also allows the rough position around the target to be scanned at high speed, without focusing, to find the required location.
Video
Three-Dimensional Optical Wave Field Microscope MINUK
Otsuka Electronics
Members Site
The Otsuka Electronics Members Site offers the following services.
We will continue to provide a wide range of content designed to enhance your professional knowledge and support your work.
Key Features of the
Members Site
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Download product catalogs
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Download technical documents
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Watch member-only videos.
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