MINUK is capable of evaluating transparent foreign substances and defects in the nano-order, obtaining height direction information in a single shot, and making non-destructive, non-contact and non-invasive measurements.
MINUK also allows the rough position around the target to be scanned at high speed, without focusing, to find the required location.
Video
Three-Dimensional Optical Wave Field Microscope MIINUK(Manual)
Otsuka Electronics
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