Medical	Medical
Analytical	Zeta Potential Particle Size Molecular Weight Capillary Electrophoresis Spherulite diam./Corr. Length
Spectrometry	Spectrometer Thickness Measurement Light Measurement FPD Evaluation Material Evaluation In-Process Evaluation

Medical

Medical
Analytical

Zeta Potential

Particle Size

Molecular Weight

Capillary Electrophoresis

Spherulite diam./Corr. Length
Spectrometry
Spectrometer

Thickness Measurement

Light Measurement

FPD Evaluation

Material Evaluation

In-Process Evaluation
- Wafer manufacturing process
- Array Spectrometer MCPD-9800
- FPD evaluation process
- LCD Cell Gap Measurement RETS series
- Built-in film thickness monitor　FE-3
- Color Filter Spectral Inspection System LCF series
- Retardation Film Inspection System　RETS-100nx
- LED evaluation process
- High-speed LED Spectrometer LE series
- Wafer manufacturing process
- Si Wafer Thickness Monitoring System　SF-3
- Built-in film thickness monitor　FE-3
- Film formation process
- Si Wafer Thickness Monitoring System　SF-3
- Built-in film thickness monitor　FE-3
- High speed retardation measurement system　RE-200
- Retardation Film Inspection System　RETS-100nx
List of Product
Discontinued Products

High speed retardation measurement system　RE-200

High quality control of Optical axis! 3σ≦0.02°
for low retardation measurement

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Features
Principle
Specifications
Examples

Features

Low (residual) retardation measurement from 0 nm
High-speed retardation (Re.) measurement and optical axis simultaneous detection
（Processing in less than 0.1 seconds, the fastest in the world）
High repeatability due to no drive
Easy to measure with few parameters to set
Various wavelengths other than 550 nm are available
Rth measurement and omni azimuthal measurement are available
（Requires optional auto-rotating tilt unit)
Combined with a tensile tester, it is possible to evaluate the photoelasticity simultaneously with the polarization characteristics of the film
(This system is custom made.）

Features

Retardation（ρ[deg.], Re[nm]）
Principal axis azimuth（θ[deg.]）
Ellipticity（ε）/Azimuth（γ）
3D refractive index（NxNyNz）

Features

Optical film, retardation film, ellipsoidal film, retardation plate, polarizing film, function added polarizing film, polarizing plate
Transparent and anisotropic materials such as resin and glass (optical strain on glass etc.)

Principle

What is RE-200?

RE-200 is available to measure phase difference (retardation) and principal axis azimuthwith high speed and high accuracy due to combine a polarization measurement module composed of a photonic crystal element (polarization element) and a CCD camera with transmissive polarization optics. Since the polarization intensity pattern is acquired with one shot of the CCD camera, there is no mechanism for rotating the polarizer, and the whole system has a compact configuration, so stable performance can be maintained even for a long time continuous measurement.

Ellipticity（ε）and Azimuth（γ） are calculated by Fitting and Fourier transform algorithm.

Optical geometry and measurement principle

Specifications

Model	RE series
Sample size	Minimum 10×10 mm ～ Maximum 100×100 mm
Measuring wavelength	550 nm （Standard type）※1
Measurement range of retardation	about 0 nm ～ 1 μm
Axis detection repeatability	0.05°（at 3σ） ※2
Detector	Polarization measurement module
Size of measurement spot	2.2 mm×2.2 mm
Light source	100 W Halogen lamp or LED source
Main body・Weight	300(W) × 560(H) ×430(D) mm 、about 20 kg