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High speed retardation measurement system RE-200

High quality control of Optical axis! 3σ≦0.02°
for low retardation measurement

 

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Features

Features
  • Low (residual) retardation measurement from 0 nm
  • High-speed retardation (Re.) measurement and optical axis simultaneous detection
    (Processing in less than 0.1 seconds, the fastest in the world)
  • High repeatability due to no drive
  • Easy to measure with few parameters to set
  • Various wavelengths other than 550 nm are available
  • Rth measurement and omni azimuthal measurement are available
    (Requires optional auto-rotating tilt unit)
  • Combined with a tensile tester, it is possible to evaluate the photoelasticity simultaneously with the polarization characteristics of the film
    (This system is custom made.)

 

Features
  • Retardation(ρ[deg.], Re[nm])
  • Principal axis azimuth(θ[deg.])
  • Ellipticity(ε)/Azimuth(γ)
  • 3D refractive index(NxNyNz)

 

Features
  • Optical film, retardation film, ellipsoidal film, retardation plate, polarizing film, function added polarizing film, polarizing plate
  • Transparent and anisotropic materials such as resin and glass (optical strain on glass etc.)

 

Principle

What is RE-200?

RE-200 is available to measure phase difference (retardation) and principal axis azimuthwith high speed and high accuracy due to combine a polarization measurement module composed of a photonic crystal element (polarization element) and a CCD camera with transmissive polarization optics. Since the polarization intensity pattern is acquired with one shot of the CCD camera, there is no mechanism for rotating the polarizer, and the whole system has a compact configuration, so stable performance can be maintained even for a long time continuous measurement.

Ellipticity(ε)and Azimuth(γ) are calculated by Fitting and Fourier transform algorithm.
Ellipticity(ε)and Azimuth(γ) are calculated by Fitting and Fourier transform algorithm.

 

Optical geometry and measurement principle

Specifications

Specifications
Model RE series
Sample size

Minimum 10×10 mm ~ Maximum 100×100 mm

Measuring wavelength 550 nm (Standard type)※1
Measurement range of retardation about 0 nm ~ 1 μm
Axis detection repeatability 0.05°(at 3σ) ※2
Detector Polarization measurement module
Size of measurement spot 2.2 mm×2.2 mm
Light source 100 W Halogen lamp or LED source
Main body・Weight 300(W) × 560(H) ×430(D) mm 、about 20 kg

 

Options

 

Rth measurement and omni azimuthal measurement are available ※ Auto-rotating tilt unit(Rotation:180°, Tilt:±50°)

Auto-rotating tilt unit

Auto-rotating tilt unitAuto-rotating tilt unit

Examples

Viewing angle improvement film A

Viewing angle improvement film A

Viewing angle improvement film B

Viewing angle improvement film B

Related Information

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