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Introduction:Particle size measurement of fine particles

1.Introduction

In recent years, research and development of new materials have become active, there is an active movement to incorporate characteristic functions of ultrafine powders as an element of industrial technology. In addition, the importance of dispersibility evaluation of inks and pigments and the particle size control of abrasive particles in the semiconductor field are increasing. Therefore, new demands for particle size measurement are being raised one after another, and new measurement technologies (measuring instruments) are being developed to respond them.

Our equipment (nanoSAQLA, ELSZ series) is based on the light scattering measurement technique. The systems are a particle size measuring instrument by dynamic light scattering method that measures the fluctuation of scattered light due to the Brownian motion of the particles, and a zeta potential measuring instrument by electrophoretic light scattering method that measures Doppler shift of scattered light while the particles are electrophoresed. They provide information on the dispersed state of fine particles in a solution.


With the dynamic light scattering method, it is possible to measure the particle size distribution in the nano and micron range from 0.6 nm to 10 μm. In addition, our instrument can measure not only the dispersion system of inorganic particles and organic particles but also a wide range of particles (colloids) with solution systems such as biological polymers and polymer electrolytes and provide information on dynamic changes such as the aggregation process of particles.

 
各種粒子の粒径範囲と測定法
Figure 1. Particle size range and measurement method of various particles

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