Retardation Film Inspection System RETS-100nx NEW
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RETS-100nx is a retardation measuring system for all kinds of films such as OLED polarizing plate, laminated retardation film and polarizing plate with retardation film for IPS liquid crystal. |
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- Specifications
- Optics
Product
■ High precision
High precision achieved due to muti-wavelength measurement
[ Reason of high precision ]
・Original High performance multi-channnel spectrophotometer is used.
・High-precision measurement is possible, because a large amount of
transmittance information can be obtained.
(The obtained transmittance information is about 500 wavelengths,
about 50 times that of other companies' products)
■ Wide measurement range (Retardation range: 0 ~ 60,000 nm)
■ Wavelength dispersion of retardation can be obtained
■ High retardation
■ Samples were replaced 10 times and the results were compared with and without axis correction
【 Sample:Retardation film R85 】
Specifications
Model | Retardation Film Inspection System RETS-100nx |
Measurement items (film, optical material) |
Retardation (wavelength dispersion), Slow axis, Rth*1, 3-D refractive index*1, etc. |
Measurement items (polarizing plate) |
Absorption axis, Polarization degree, Extinction ratio, Various chromaticities, Various transmittances, etc. |
Measurement items (LCD cell) |
Cell gap, Pre-tilt angle*1,Twist angle, Alignment angle, etc. |
Retardation measurement range | 0 ~ 60,000 nm |
Retardation repeatability | 3σ ≦ 0.08 nm (quartz wave plate about 600 nm) |
Cell gap measurement range | 0 ~ 600 μm (when Δn=0.1) |
Cell gap repeatability | 3σ ≦ 0.005 μm (about 3 μm, when Δn=0.1) |
Axis detect repeatability | 3σ ≦ 0.08° (quartz wave plate about 600 nm) |
Wavelenth range | 400 ~ 800 nm (selectable other range) |
Detector | High performance multi-channnel spectrophotometer |
Measurement spot | φ2 mm (standard spec.) |
Light source | 100 W Halogen lamp |
Data processing unit | PC, Monitor |
Standard sample stage | 100 mm × 100 mm (Fixed stage) |
Options | ・Extremely high retardation measurement ・Multi-layered film measurement ・Axis angular correction ・Automatic Cartesian stage ・Automatic tilt-rotation stage |
*1 Require optional Automatic tilt-rotation stage
Optics
- Product
- Specifications
- Optics
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