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Retardation Film Inspection System RETS-100nx NEW

RETS-100nx is a retardation measuring system for all kinds of films such as OLED polarizing plate, laminated retardation film and polarizing plate with retardation film for IPS liquid crystal.
Extremely high retardation as 60,000 nm can be measured with high speed and high precision.
Lamination state of film can be measured "non-destructive without peeling".
Furthermore, on the operation, simple software and a correction function that copes with misalignment due to sample re-placement are installed. High-precision measurement can be easy to use.

Product

Features
High-precision measurement due to our original spectrometer

■ High precision


 High precision achieved due to muti-wavelength measurement

Reason of high precision
  [ Reason of high precision ]
   ・Original High performance multi-channnel spectrophotometer is used.
   ・High-precision measurement is possible, because a large amount of
    transmittance information can be obtained.
    (The obtained transmittance information is about 500 wavelengths,
    about 50 times that of other companies' products)

 


■ Wide measurement range (Retardation range: 0 ~ 60,000 nm)

Wide measurement range (Retardation range: 0 ~ 60000 nm)

 


■ Wavelength dispersion of retardation can be obtained

Wavelength dispersion of retardation can be obtained

 

Extremely high retardation measurement -Super Retardation Film can be measured with high speed and high precision-

High retardation
High retardation
High retardation

 

Multi-layered film measurement -Lamination state of various films can be measured non-destructive without peeling-

Multi-layered film measurement -Lamination state of various films can be measured non-destructive without peeling-

 

Correction function for axis direction -Easy and reproducible measurement even if sample is misaligned-

■ Samples were replaced 10 times and the results were compared with and without axis correction
  【 Sample:Retardation film R85 】

Sample were replaced 10 times and the results were compared with and without axis correction

 

Simple software -Measurement time and processing time are greatly reduced. Greatly improved operability-

Simple softwear -Measurement time and processing time are greatly reduced. Greatly improved operability-

Specifications

Specifications
  Model  Retardation Film Inspection System RETS-100nx
 Measurement items
 (film, optical material)
 Retardation (wavelength dispersion), Slow axis, Rth*1,
 3-D refractive index*1, etc.
 Measurement items
 (polarizing plate)
 Absorption axis, Polarization degree, Extinction ratio,
 Various chromaticities, Various transmittances, etc.
 Measurement items
 (LCD cell)
 Cell gap, Pre-tilt angle*1,Twist angle, Alignment angle, etc.
 Retardation measurement range  0 ~ 60,000 nm
 Retardation repeatability  3σ ≦ 0.08 nm (quartz wave plate about 600 nm)
 Cell gap measurement range  0 ~ 600 μm (when Δn=0.1)
 Cell gap repeatability  3σ ≦ 0.005 μm (about 3 μm, when Δn=0.1)
 Axis detect repeatability  3σ ≦ 0.08° (quartz wave plate about 600 nm)
 Wavelenth range  400 ~ 800 nm (selectable other range)
 Detector  High performance multi-channnel spectrophotometer
 Measurement spot  φ2 mm (standard spec.)
 Light source  100 W Halogen lamp
 Data processing unit  PC, Monitor
 Standard sample stage  100 mm × 100 mm (Fixed stage)
 Options  ・Extremely high retardation measurement
 ・Multi-layered film measurement
 ・Axis angular correction
 ・Automatic Cartesian stage
 ・Automatic tilt-rotation stage

*1 Require optional Automatic tilt-rotation stage

Optics

Features
Fixed stage 【 Option:Axis angular correction 】

Fixed stage

 

Automatic tilt-rotation stage 【 Option 】

Automatic tilt-rotation stage 【 Option 】

 

Automatic Cartesian stage 【 Option 】

Automatic Cartesian stage 【 Option 】

Related Information

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