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Three-Dimensional Optical Wave Field Microscope MINUK NEW
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MINUK is capable of evaluating transparent foreign substances and defects in the nano-order, obtaining height direction information in a single shot, and making non-destructive, non-contact and non-invasive measurements. |
- Product
- Specification
- Applications
Product
- Evaluating transparent foreign substances and defects in the nano-order．
- Obtaining instant depth direction information in single shot.
- High-speed measurement without focus.
- Non-destructive, non-contact and non-invasive measurement.
- Easy to find the required location by scanning rough position around the target at high-speed, without focus.
Specification
Specification
| Resolution x,y | 691 nm(one shot),488 nm(composition) | |||
| Field of view x,y | 700×700 μm | |||
| Resolution z | 10 nm（Retardation） | |||
| Digital refocusing range z | ±700 μm | |||
| Sample size | 100×80×t20 mm （when versatile sample holder attached） |
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| Sample stage | Automatic XY stage for fine adjustment X:±10 mm Y：±10 mm Stage for rough adjustment X：129 mm Y：85 mm |
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| Laser | Wavelength 638 nm Output 0.39 mW or less, Class1 (Irradiation strength to the sample) |
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| Demention (Width×Depth×Height) mm |
Main unit:505（W）×630（D）×439（H） | |||
| Weight | 41 kg | |||
| Power consumption | Main unit:290 VA *PC and Accessory not included. |
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Applications
The nm-order shape information can be obtained in a non-contact, non-destructive and non-invasive manner. Acquiring depth-direction information in a single shot allows to visualize and quantify scratches on the surface of transparent films and the cross-sectional shape of defects that are invisible to the naked eye.
Fillers inside transparent films can be observed in a single shot, which are invisible to the naked eye. Also, by changing the focus in the depth direction after measurement allows to identify the filler at each depth.
- Product
- Specification
- Applications
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